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Conferences in DBLP
- Pascal Traverse, Isabelle Lacaze, Jean Souyris
A Process Toward Total Dependability - Airbus Fly-by-Wire Paradigm. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:1- [Conf]
- Roy Friedman, Achour Mostéfaoui, Michel Raynal
Building and Using Quorums Despite any Number of Process of Crashes. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:2-19 [Conf]
- Josef Widder, Gérard Le Lann, Ulrich Schmid
Failure Detection with Booting in Partially Synchronous Systems. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:20-37 [Conf]
- Roberto Baldoni, Stefano Cimmino, Carlo Marchetti
Total Order Communications: A Practical Analysis. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:38-54 [Conf]
- Gildas Avoine, Felix C. Gärtner, Rachid Guerraoui, Marko Vukolic
Gracefully Degrading Fair Exchange with Security Modules. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:55-71 [Conf]
- Sandeep S. Kulkarni, Ali Ebnenasir
Adding Fault-Tolerance Using Pre-synthesized Components. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:72-90 [Conf]
- Jens Chr. Lisner
Efficiency of Dynamic Arbitration in TDMA Protocols. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:91-102 [Conf]
- Nithin Nakka, Giacinto Paolo Saggese, Zbigniew Kalbarczyk, Ravishankar K. Iyer
An Architectural Framework for Detecting Process Hangs/Crashes. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:103-121 [Conf]
- Dakai Zhu, Rami G. Melhem, Daniel Mossé
Energy Efficient Configuration for QoS in Reliable Parallel Servers. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:122-139 [Conf]
- Christophe Honvault, Marc Le Roy, Pascal Gula, Jean-Charles Fabre, Gérard Le Lann, Eric Bornschlegl
Novel Generic Middleware Building Blocks for Dependable Modular Avionics Systems. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:140-153 [Conf]
- A. V. Singh, Louise E. Moser, P. M. Melliar-Smith
Integrating Fault Tolerance and Load Balancing in Distributed Systems Based on CORBA. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:154-166 [Conf]
- Namyoon Woo, Hyungsoo Jung, Dongin Shin, Hyuck Han, Heon Young Yeom, Taesoon Park
Performance Evaluation of Consistent Recovery Protocols Using MPICH-GF. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:167-178 [Conf]
- Bjarne E. Helvik, Hein Meling, Alberto Montresor
An Approach to Experimentally Obtain Service Dependability Characteristics of the Jgroup/ARM System. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:179-198 [Conf]
- Meine van der Meulen, Miguel A. Revilla
The Effectiveness of Choice of Programming Language as a Diversity Seeking Decision. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:199-209 [Conf]
- Frank Ortmeier, Wolfgang Reif, Gerhard Schellhorn
Formal Safety Analysis of a Radio-Based Railroad Crossing Using Deductive Cause-Consequence Analysis (DCCA). [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:210-224 [Conf]
- Henrique Madeira
Dependability Challenges and Education Perspectives. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:225-225 [Conf]
- Manfred Reitenspieß
Availability in Industry and Science - A Business Perspective -. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:226-229 [Conf]
- David de Andrés, José Albaladejo, Lenin Lemus, Pedro J. Gil
Fast Run-Time Reconfiguration for SEU Injection. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:230-245 [Conf]
- Raul Barbosa, Jonny Vinter, Peter Folkesson, Johan Karlsson
Assembly-Level Pre-injection Analysis for Improving Fault Injection Efficiency. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:246-262 [Conf]
- Gergely Pintér, Henrique Madeira, Marco Vieira, István Majzik, András Pataricza
A Data Mining Approach to Identify Key Factors in Dependability Experiments. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:263-280 [Conf]
- Nicky Williams, Bruno Marre, Patricia Mouy, Muriel Roger
PathCrawler: Automatic Generation of Path Tests by Combining Static and Dynamic Analysis. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:281-292 [Conf]
- Caiazza Alessandro, Roberto Di Maio, Fernando Scalabrini, Fabio Poli, Leonardo Impagliazzo, Arturo M. Amendola
A New Methodology and Tool Set to Execute Software Test on Real-Time Safety-Critical Systems. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:293-304 [Conf]
- Giuseppe De Nicola, Pasquale di Tommaso, Rosaria Esposito, Francesco Flammini, Pietro Marmo, Antonio Orazzo
A Grey-Box Approach to the Functional Testing of Complex Automatic Train Protection Systems. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:305-317 [Conf]
- Maciej Bellos, Dimitris Nikolos
Deterministic Test Vector Compression / Decompression Using an Embedded Processor. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:318-331 [Conf]
- Jaan Raik, Raimund Ubar, Sergei Devadze, Artur Jutman
Efficient Single-Pattern Fault Simulation on Structurally Synthesized BDDs. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:332-344 [Conf]
- Daniel J. Rosenkrantz, Sanjay Goel, S. S. Ravi, Jagdish Gangolly
Structure-Based Resilience Metrics for Service-Oriented Networks. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:345-362 [Conf]
- Miklós Molnár, Alexandre Guitton, Bernard Cousin, Raymond Marie
Efficient Protection of Many-to-One Communications. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:363-378 [Conf]
- Daniel Gil, J. Gracia, J. C. Baraza, Pedro J. Gil
Impact of Faults in Combinational Logic of Commercial Microcontrollers. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:379-390 [Conf]
- Tamás Bartha, István Varga, Alexandros Soumelidis, Géza Szabé
Implementation of a Testing and Diagnostic Concept for an NPP Reactor Protection System. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:391-402 [Conf]
- Ondrej Novák, Jirí Zahrádka, Zdenek Plíva
COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:403-414 [Conf]
- Jane Huffman Hayes, Inies C. M. Raphael, Vinod Kumar Surisetty, Anneliese Amschler Andrews
Fault Links: Exploring the Relationship Between Module and Fault Types. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:415-434 [Conf]
- Stefan Wagner, Jan Jürjens
Model-Based Identification of Fault-Prone Components. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:435-452 [Conf]
- Eliane Martins, Vanessa Gindri Vieira
Regression Test Selection for Testable Classes. [Citation Graph (0, 0)][DBLP]
EDCC, 2005, pp:453-470 [Conf]
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