Journals in DBLP

IEEE Transactions on Reliability
2004, volume: 53, number: 2

1. Liudong Xing, Joanne Bechta Dugan
   Comments on PMS BDD generation in 'A BDD-based algorithm for Reliability Analysis of phased-mission systems'. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2004, v:53, n:2, pp:169-173 [Journal]
   
2. Liudong Xing, Joanne Bechta Dugan
   A separable ternary decision diagram based analysis of generalized phased-mission reliability. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2004, v:53, n:2, pp:174-184 [Journal]
   
3. Rafael Pérez-Ocón, Delia Montoro-Cazorla
   Transient analysis of a repairable system, using phase-type distributions and geometric processes. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2004, v:53, n:2, pp:185-192 [Journal]
   
4. Lirong Cui, W. Kuo, H. T. Loh, M. Xie
   Optimal allocation of minimal & perfect repairs under resource constraints. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2004, v:53, n:2, pp:193-199 [Journal]
   
5. Debra A. Elkins, M. A. Wortman
   An examination of correlation effects among warranty claims. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2004, v:53, n:2, pp:200-204 [Journal]
   
6. Yinong Chen, Zhongshi He
   Bounds on the reliability of distributed systems with unreliable nodes & links. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2004, v:53, n:2, pp:205-215 [Journal]
   
7. Pin-Han Ho, János Tapolcai, H. T. Mouftah
   On achieving optimal survivable routing for shared protection in survivable next-generation Internet. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2004, v:53, n:2, pp:216-225 [Journal]
   
8. M. T. Todinov
   Reliability governed by the relative locations of random variables following a homogeneous Poisson Process in a finite domain. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2004, v:53, n:2, pp:226-237 [Journal]
   
9. Alma Riska, Evgenia Smirni, Gianfranco Ciardo
   Exact analysis of a class of GI/G/1-type performability models. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2004, v:53, n:2, pp:238-249 [Journal]
   
10. K. S. Chandra, T. V. Ramanathan
    Modeling inefficiencies in a reliability system using stochastic frontier regression. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:2, pp:250-254 [Journal]
    
11. D. Roy
    Discrete Rayleigh distribution. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:2, pp:255-260 [Journal]
    
12. M. S. Finkelstein
    Alternative time scales for systems with random usage. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:2, pp:261-264 [Journal]
    
13. M. S. Finkelstein
    On the exponential formula for reliability. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:2, pp:265-268 [Journal]
    
14. Yiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu
    Enhancing reliability of RTL controller-datapath circuits via Invariant-based concurrent test. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:2, pp:269-278 [Journal]
    
15. Jingsong Xie, Michael G. Pecht
    Contact discontinuity modeling of electromechanical switches. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:2, pp:279-283 [Journal]
    
16. Francis G. Pascual
    Optimal test planning for the fatigue-limit model when the fatigue-limit distribution is known. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:2, pp:284-292 [Journal]
    
17. Stefan Dilhaire, Stéphane Grauby, S. Jorez, Wilfrid Claeys
    Strain energy imaging of a power MOS transistor using speckle interferometry. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:2, pp:293-296 [Journal]