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J. Jomaah:
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Publications of Author
- F. Dieudonné, F. Daugé, J. Jomaah, C. Raynaud, F. Balestra
An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1417-1420 [Journal]
- M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, J. Jomaah, G. Ghibaudo
Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1361-1366 [Journal]
- S. Haendler, J. Jomaah, G. Ghibaudo, F. Balestra
Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:6, pp:855-860 [Journal]
- M. Fadlallah, G. Ghibaudo, J. Jomaah, M. Zoaeter, G. Guégan
Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2002, v:42, n:1, pp:41-46 [Journal]
- M. A. Exarchos, G. J. Papaioannou, J. Jomaah, F. Balestra
The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:9-11, pp:1386-1389 [Journal]
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